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Per Persson. Photo.

Per Persson

Dean

Per Persson. Photo.

Epitaxial growth of β -Ga 2 O 3 by hot-wall MOCVD

Author

  • Daniela Gogova
  • Misagh Ghezellou
  • Dat Q. Tran
  • Steffen Richter
  • Alexis Papamichail
  • Jawad Ul Hassan
  • Axel R. Persson
  • Per O. Å. Persson
  • Olof Kordina
  • Bo Monemar
  • Matthew Hilfiker
  • Mathias Schubert
  • Plamen P. Paskov
  • Vanya Darakchieva

Summary, in English

The hot-wall metalorganic chemical vapor deposition (MOCVD) concept, previously shown to enable superior material quality and high
performance devices based on wide bandgap semiconductors, such as Ga(Al)N and SiC, has been applied to the epitaxial growth of
β-Ga2O3. Epitaxial β-Ga2O3 layers at high growth rates (above 1 μm/h), at low reagent flows, and at reduced growth temperatures
(740 ○C) are demonstrated. A high crystalline quality epitaxial material on a c-plane sapphire substrate is attained as corroborated by a combination of x-ray diffraction, high-resolution scanning transmission electron microscopy, and spectroscopic ellipsometry measurements. The
hot-wall MOCVD process is transferred to homoepitaxy, and single-crystalline homoepitaxial β-Ga2O3 layers are demonstrated with a 201 ¯
rocking curve width of 118 arc sec, which is comparable to those of the edge-defined film-fed grown (201) ¯ β-Ga2O3 substrates, indicative of
similar dislocation densities for epilayers and substrates. Hence, hot-wall MOCVD is proposed as a prospective growth method to be further
explored for the fabrication of β-Ga2O3

Department/s

  • NanoLund: Centre for Nanoscience
  • Solid State Physics

Publishing year

2022-05-01

Language

English

Pages

055022-055022

Publication/Series

AIP Advances

Volume

12

Issue

5

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Topic

  • Condensed Matter Physics

Status

Published

ISBN/ISSN/Other

  • ISSN: 2158-3226